Wallner Testsysteme Home
about us products privacy contact

High-Speed Modular Component Testsystems

for discrete Semiconductors including Handler Control.

Our testsystems offer the highest precision, testspeed and versatility on the marketplace due to embedded processors and Realtime Operating Systems.

Stimulus Measurement Units (SMUs)

Stimulus: µV to 8000 V
nA to 20 A
Measurement: nV to 8000 V
pA to 20 A
pF to nF
Time Control: µsec. Resolution
Adaption: up to 20 Component Pins with
Serial Interface for Prober / Handler / Sorting
Support: Easy to use Graphical User Interface Software
VISA Drivers
Comprehensive on-Site Support at Design / Integration of Production Machines

Don’t hesitate to consult us for data sheets.